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TRF7970A
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SLOS743K – AUGUST 2011 – REVISED APRIL 2014
6.14.3.4 Test Registers
6.14.3.4.1 Test Register (0x1A)
Table 6-54. Test Register (0x1A) (for Test or Direct Use)
Default: 0x00 at POR = H and EN = L.
Bit
B7
B6
B5
Name
OOK_Subc_In
MOD_Subc_Out
MOD_Direct
Function
Subcarrier Input
Subcarrier Output
Direct TX modulation and
RX reset
Description
OOK Pin becomes decoder digital input
MOD Pin becomes receiver digitized subcarrier output
MOD pin becomes input for TX modulation control by the MCU
o_sel = L: First stage output used for analog out and digitizing
B4
B3
B2
B1
B0
o_sel
low2
low1
zun
Test_AGC
First stage output selection
Second stage gain -6 dB,
HP corner frequency/2
First stage gain -6 dB, HP
corner frequency/2
Input followers test
AGC test, AGC level is
seen on rssi_210 bits
o_sel = H: Second Stage output used for analog out and digitizing
6.14.3.4.2 Test Register 0x1B
Table 6-55. Test Register (0x1B) (for Test or Direct Use)
Default: 0x00 at POR = H and EN = L. When a test_dec or test_io is set IC is switched to test mode. Test Mode persists until a stop
condition arrives. At stop condition the test_dec and test_io bits are cleared.
Bit
Name
Function
Description
B7
B6
B5
B4
test_rf_level
RF level test
B3
B2
B1
B0
test_io1
test_io0
test_dec
clock_su
I/O test
Decoder test mode
Coder clock 13.56 MHz
Not implemented
For faster test of coders
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